Olympus MX63 Instructions Manual page 25

Semiconductor/fpd/industrial inspection microscopes
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Observation method
Units
Light sources
U-LLG150
U-LLG300
MX-LLHECBL
MX-TILLA
MX-TILLB
LG-SF
Revolving
U-P5REMC
nosepiece
U-D6REMC
U-D5BDREMC
U-P5BDREMC
U-D6BDREMC
Objective
BD-M-AD
adapter
Stage
MX-SIC6R2
MX-SIC8R
MX-SIC1412R2
Stage option
BH3-WHP6
BH2-WHR43
BH2-WHR54
BH2-WHR65
BH3-SP6
MX-WHPR86
BH3-SPG6
MX-WHPR128
MX-SPG1412
MX-MH6
Slider for reflected
U-25ND6
light illumination
U-25ND25
U-25ND50
U-25LBD
U-25IF550
U-25Y48
U-25L42
U-25FR
U-25LBA
U-25
U-BP1100IR
U-BP1200IR
Slider for
U-DICR
differential
U-DICRHC
interference
contrast
U-DICRHC
Reflected light
Brightfield/
Brightfield Darkfield
darkfield
simultaneously
: Combination available (including units with restrictions)
: Combination prohibited
: Unnecessary for observation
Differential
Simple
interference
Fluorescence Infrared
polarization
contrast
MX63/MX63L
Transmitted light
Simple
Brightfield
polarization
19
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