Using Limit Lines To Test A Device; Setting Up The Measurement Parameters - Agilent Technologies 8753ET User Manual

Using Limit Lines to Test a Device

Limit testing is a measurement technique that compares measurement data to constraints
that you define. Depending on the results of this comparison, the analyzer will indicate if
your device either passes or fails the test.
Limit testing is implemented by creating individual flat, sloping, and single-point limit
lines on the analyzer display. When combined, these lines can represent the performance
parameters for your device under test. The limit lines created on each measurement
channel are independent of each other.
This example measurement shows you how to test a bandpass filter using the following
procedures:
• creating flat limit lines
• creating sloping limit lines
• creating single point limit lines
• editing limit segments
• running a limit test

Setting Up the Measurement Parameters

1. Connect your test device as shown in
Figure 1-60 Connections for SAW Filter Example Measurement
2. Press and choose the measurement settings. For this example the
Preset
measurement settings are as follows:
•
Trans: FWD S21 (B/R)
Meas
•
Center 134
•
Span 50
•
Scale Ref AUTO SCALE
You may also want to select settings for the number of data points, power, averaging,
and IF bandwidth.
Figure
or on ET models:
M/µ
M/µ
Using Limit Lines to Test a Device
1-60.
TRANSMISSN
Making Measurements
1-75