Making Measurements
Using This Chapter
Using This Chapter
This chapter contains the following example procedures for making measurements. Mixer
and time domain measurements are covered in
and
Chapter 3 , "Making Time Domain Measurements."
use most display, marker, and sequencing functions.
• Making a Basic Measurement
• Measuring Magnitude and Insertion Phase Response
• Measuring Electrical Length and Phase Distortion
— Electrical Length
— Phase Distortion (deviation from linear phase, group delay)
• Characterizing a Duplexer (ES Analyzers Only)
• Measuring Amplifiers
— Measuring Harmonics (Option 002 Only)
— Measuring Gain Compression
— Measuring Gain Compression and Reverse Isolation Simultaneously
(ES Analyzers Only)
— Making High Power Measurements (ES Analyzers Only)
• Using the Swept List Mode to Test a Device
• Using Limit Lines to Test a Device
• Using Test Sequencing to Test a Device
• Single Connection for Multiple Measurements
The following chapters describe how to use more instrument functions (as indicated by
their chapter titles):
•
Chapter 4 , "Printing, Plotting, and Saving Measurement Results"
•
Chapter 5 , "Optimizing Measurement Results"
•
Chapter 6 , "Calibrating for Increased Measurement Accuracy"
1-2
Chapter 2 , "Making Mixer Measurements"
This chapter also describes how to