Olympus USPM-RU-W Series Operation Manual page 65

Optical measuring instrument
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Confirming the result of film thickness analysis
Confirm the result on the THICKNESS and THICKNESS INFO windows. For details of the
windows, see the [7.8 [THICKNESS] window] and [7.9 [THICKNESS INFO] window].
PV8959-F4E005
A film thickness analysis method and
its result are displayed. For the
contents of the display, see the [7.8
[THICKNESS] window].
The state of film thickness analysis is
displayed; film thickness is not
normally analyzed when the analysis
state is improper. For the analysis
state, see the [7.9 [THICKNESS
INFO] window ].
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