Olympus USPM-RU-W Series Operation Manual page 44

5.3. Wavelength offset
(1) Outline of wavelength offset
Wavelength offset is performed to modify the measurement by this unit of the display
position of spectral reflectance data in the direction of the wave by comparing it with
the position of a certain reference sample for which the peak positions of its spectral
reflectance is known (measured by another standard device).
In the offset, you may shift the whole measured wavelength to a shorter or longer
wavelength in ±10 [nm] increments.
(2) How to calibrate wavelength:
The following section describes how to calibrate using the supplied calibration
sample.
Setup of the work configuration file
Refer to 4.5 Setup of the work configuration file.
Prepare the calibration sample
Put the calibration sample on the stage. Bring the reflecting mirror under the clear glass
(not the clear glass itself) into focus.
Reflecting
mirror
Adjusting the sampling interval
Refer to 4.8 Adjusting the sampling interval.
Measurement of background
Click the BACKGROUND1 button to conduct a measurement of background.
Measurement of reference
Measure the backside plane of clear glass as the reference face.
PV8344F4E013
Blue
Calibration sample
NG
Reflecting
mirror
42
Clear
Good