Ds1/E1 Testing - Alcatel-Lucent 1665 Installation Manual

Stand-alone installation testing
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Note:
test. Test all circuit pack positions which have DSX cabling.
Note:
and replace any failed units. If any cabling is corrected or units replaced, repeat the
Local Equipment and cross-connect tests until the units pass without failures.
A properly grounded ESD wrist strap MUST be worn when handling circuit packs.
Unterminated optical connectors may emit laser radiation. Do not view beam with
optical instruments.

DS1/E1 testing

DS1/E1 testing procedure
Perform the following steps for all Alcatel-Lucent 1665 DMXtend shelf function unit slots
that are cabled to a DSX-1.
Function unit slot A/B must be cabled to the DSX-1 and must contain a DS1/DS3/16/3
(LNW39/LNW391/LNW84), 16/DS1 (LNW112) or OC-3/16DS1 (LNW40) circuit pack
in order to perform these tests on the DS1/E1 portion of the cabling. function unit slot D or
G must be cabled to the DSX-1 and must contain either a 28DS1 (LNW7) or 56DS1E1
(LNW8/LNW801) circuit pack in order to perform these tests. If the shelf is not fully
populated, it may be necessary to move the circuit pack(s) from slot to slot in order to test
all DS-1 cabling.
Note:
support the first 16 DS1s of the A function group.
This procedure requires the use of a DS1/E1 test set.
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1
Set the DS1/E1 test set to transmit and receive a Quasi-Random Sequence Signal (QRSS)
with B8ZS formatting.
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Alcatel-Lucent 1665 DMXtend R10.0
365-372-327R10.0 Issue 1
January 2013
If the shelf is not fully equipped, move circuit packs around and repeat the
After completing this test, isolate and correct any incorrect wiring or isolate
CAUTION
ESD hazard
WARNING
Laser hazard
The LNW39/LNW391/LNW84 (DS1/DS3/16/3) or LNW112 (16DS1) only
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