GE LOGIQ E9 Service Manual page 295

GE
D 5535208-100, R
IRECTION
7-5-8-3 GFI (cont'd)
Name: GFI Swept Demodulator Test
Description: Performs a signal path test of the swept demodulator FPGA on the GFI
Run Time: 00:05
If this test failed:
1.) Replace the GFI board.
Name: GFI Swept Demodulator Engineering Test (Not used in the field)
Name: GFI Front End Interface Test
Description: Test that the GFI can access Front End cards
Run Time: 00:06
If this test failed:
1.) Replace the GFI board.
2.) If the diagnostic identifies problems with other boards, run tests on those boards also.
3.) Replace any other failed boards as identified by the diagnostics for those boards.
Name: GFI Analog Test
Description: Tests the analog circuitry of the GFI Board.
NOTE: Used for test purposes only. There may not be any symptoms displayed by the system.
Run Time: 00:03
If this test failed:
1.) Also run the Analog RX Tests (high, medium, low gain) for a complete test of the GFI gain.
See:
2.) Replace the GFI board.
Name: GFI Memory Access Test
Description: Tests the internal and external RAM of the GFI Board. (Same as the GFI Memory Test)
Run Time: 00:01
If this test failed:
1.) Replace the GFI board.
. 2
EV
7-5-8-8 "Analog Receive" on page
Chapter 7 Diagnostics/Troubleshooting
7-54.
LOGIQ E9 S M
ERVICE ANUAL
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