Measurement Setup - Agilent Technologies 4155C User Manual

Precision semiconductor parameter analyzers
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Specifications
Functions

Measurement Setup

Fill-in-the-blanks using front-panel or full-size external keyboard
Load settings from a diskette
Program using internal Instrument BASIC or via GPIB
HELP function
Library: Default Measure Setup, Vce-Ic, Vds-Id, Vgs-Id, and Vf-If are
pre-defined softkeys
User-defined measurement setup library
Auto file load function on power-up
Measurement Capability
The 4155C/4156C can perform dc or pulsed force/measure, and stress force. For dc,
voltage/current sweep and sampling (time domain) measurements are available.
Voltage/Current Sweep Measurement Characteristics
SMUs or VSUs can be set using VAR1 (primary sweep), VAR2 (subordinate
sweep), VAR1' (synchronous sweep), or CONST (constant output).
VAR1
Primary sweep, controls the staircase (dc or pulsed) voltage or current sweep.
Number of steps
Sweep type
Sweep direction
Hold time
Delay time
VAR2
Subordinate linear staircase or linear pulsed sweep. After primary sweep is
completed, the VAR2 unit output is incremented. Maximum number of steps is
128.
8-20
Maximum 1001 for one VAR1 sweep.
Linear or logarithmic
Single or double sweep
Initial wait time or wait time after VAR2 is set, 0 to 655.35 s
with 10 ms resolution
Wait time from VAR1 step to the start of the measurement, 0
to 65.535 s with 100 μs resolution
Agilent 4155C/4156C User's Guide Vol.1, Edition 11

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