IBM System Storage DS3000 Programming Manual page 344

Syntax
tart hostCard [(1 | 2 | 3 | 4)] controller [(a | b)] diagnostic
diagnosticType=(basic | extended)
[extendedTestID=(EDC | DMA | RAM | internalLoopback)]
Parameters
Parameter
hostCard
controller
diagnosticType
extendedTestID
testIterations
Extended Test Option for
Fibre Channel
EDC
DMA
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IBM System Storage DS3000, DS4000, and DS5000: Command Line Interface and Script Commands Programming Guide
Description
The identifier for host interface card on which you want to
run the diagnostic tests. Valid host interface card identifiers
are 1, 2, 3, or 4. The value of the identifier is for the position
of the host interface card in the controller enclosure or drive
enclosure. The position of the host interface card depends on
the type of controller enclosure or drive enclosure in your
storage subsystem. See the Notes for more information about
the host interface card identifier and the position of the host
interface cards in a controller enclosure. Enclose the
controller identifier in square brackets ([ ]).
The controller that has the host interface card on which you
want to run the diagnostic tests. Valid controller identifiers
are a or b, where a is the controller in slot A, and b is the
controller in slot B. Enclose the controller identifier in square
brackets ([ ]). If you do not specify a controller, the storage
management software returns a syntax error.
The level of diagnostic testing that you want to run on the
host interface card. You can run one of these levels of
testing:
basic – This option validates the ability of the host interface
card to transport I/O data. This option takes approximately
30 seconds to complete.
extended – This option enables you to run more
comprehensive diagnostic tests on the host interface card.
This parameter selects the extended test option that you
want to run.
If you choose the extended parameter, you also must use the
extendedTestID parameter and one of the extended test
options.
The number of times that you want to repeat the test.
Description
This option tests the Error Detection and Correction (EDC)
generation, verification, and deletion functionality of the
QE4 chip. This option tests all modes of the EDC operation,
such as, insert, verify, and delete EDC data.
This option tests the capability of the QE4 chip to take part
in a Direct Memory Access (DMA) operation. The DMA can
be internal to the chip or can be performed using the
services of the raw pool within the Reconfigurable Processor
Assembly (RPA) memory.