Table of Contents
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Advanced Diagnostics
Contents
7
Cabinet I/O.............................................................................................................. 136
7.1
Field Diagnostics ....................................................................................... 136
7.2
Input Configuration ................................................................................... 137
7.2.1
Frequency/Binary Inputs ................................................................ 137
7.2.2
Binary Inputs.................................................................................. 138
7.2.3
Temperature/Binary Inputs............................................................. 138
7.2.4
Board Humidity .............................................................................. 139
7.2.5
Board Temperature ........................................................................ 139
7.3
Output Configuration................................................................................. 139
7.4
On/Off Controllers...................................................................................... 140
7.5
FF Channels for the I/O Transducer Block............................................... 141
7.6
Cabinet Management Applications and I/O Blocks................................ 141
Configuring Typical Cabinet Management Applications Manually .. 142
7.6.1
8
Appendix ................................................................................................................ 144
8.1
Measured Values / Parameters ................................................................. 144
8.1.1
Board Type..................................................................................... 144
8.1.2
Communication Active ................................................................... 144
8.1.3
Current........................................................................................... 144
8.1.4
Unbalance ..................................................................................... 144
8.1.5
Active Field Devices....................................................................... 145
8.1.6
Communication Error Statistics...................................................... 145
8.1.7
History Recording .......................................................................... 145
8.1.8
Jitter............................................................................................... 145
Noise ............................................................................................. 147
8.1.9
8.1.10 Polarity........................................................................................... 147
8.1.11 Power Supply Voltage .................................................................... 147
8.1.12 Signal Level ................................................................................... 148
8.1.13 Trunk Surge Protector Alarm .......................................................... 148
8.1.14 Device Coupler Alarms .................................................................. 148
8.1.15 Voltage........................................................................................... 148
8.1.16 Measured Values by Motherboard Type ......................................... 148
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