Single-Channel Safety Application, Proof Test Interval 10 Years; Table 19: Safety Parameters For Single-Channel Safety Application - WAGO -I/O-SYSTEM 750 Manual

40 Device Description
4.6.7.3

Single-channel Safety Application, Proof Test Interval 10 Years

Table 19: Safety Parameters for Single-Channel Safety Application – 10 Years
Maximum safety integrity level
acc. EN 62061
Maximum safety integrity level
acc. IEC 61508
Maximum performance level
acc. EN ISO 13849-1
Proof test interval/usage duration
Probability of failure
*)
PFD ,
Proof test interval
10 years
(low demand mode)
(IEC 61508)
Probability of failure
*)
PFH ,
Proof test interval
10 years
(high demand mode)
(IEC 61508)
Hardware fault tolerance HFT with
single-channel application
(IEC 61508 / EN ISO 13849-1)
DC (diagnostic coverage level)
MTTF
d
(Mean Time To Failure dangerous)
*)
PFD: Probability of a dangerous failure on demand
PFH: Probability of a dangerous failure per hour
Manual
Version 1.4.2, valid from HW/SW Version 01/02
750-667/000-003 4FDI/4FDO 24V/2A PROFIsafe V2 iPar
for 1 input
(input to fieldbus)
for 1 input and
1 single-channel
output (input to
fieldbus and fieldbus
to output)
for 4 inputs and
4 single-channel
outputs (inputs to
fieldbus and fieldbus
to outputs)
for 1 input
(input to fieldbus)
for 1 input and
1 single-channel
output (input to
fieldbus and fieldbus
to output)
for 4 inputs and
4 single-channel
outputs (inputs to
fieldbus and fieldbus
to outputs)
WAGO-I/O-SYSTEM 750
SIL2
SIL2
Cat. 2/PL d
10 years
-5
8.13 × 10 (0.81 % of all PFD from
-2
10 at SIL2)
-4
1.25 × 10 (1.25 % of all PFD from
-2
10 at SIL2)
-4
2.54 × 10 (2.54 % of all PFD from
-2
10 at SIL2)
-9
1.86 × 10 (0.19 % of all PFH from
-6
10 at SIL2)
-9
2.86 × 10 (0.29 % of all PFH from
-6
10 at SIL2)
-9
5.80 × 10 (0.58 % of all PFH from
-6
10 at SIL2)
0 (1 error in the application can lead
to a failure of the safety equipment)
96 %
> 100 years