Safety Parameters; Two-Channel Safety Application, Proof Test Interval 10 Years; Table 17: Safety Parameters For 2-Channel Safety Applications - 10 Years - WAGO -I/O-SYSTEM 750 Manual

38 Device Description
4.6.7

Safety Parameters

4.6.7.1

Two-channel Safety Application, Proof Test Interval 10 Years

Table 17: Safety Parameters for 2-Channel Safety Applications – 10 Years
Maximum safety integrity level
acc. EN 62061
Maximum safety integrity level
acc. IEC 61508
Maximum performance level
acc. EN ISO 13849-1
Proof test interval/usage duration
Probability of failure
*)
PFD ,
Proof test interval
10 years
(low demand mode)
(IEC 61508)
Probability of failure
*)
PFH ,
Proof test interval
10 years
(high demand mode)
(IEC 61508)
Hardware fault tolerance HFT with
two-channel application
(IEC 61508 / EN ISO 13849-1)
DC (diagnostic coverage level)
MTTF
d
(Mean Time To Failure dangerous)
*)
PFD: Probability of a dangerous failure on demand
PFH: Probability of a dangerous failure per hour
Manual
Version 1.4.2, valid from HW/SW Version 01/02
750-667/000-003 4FDI/4FDO 24V/2A PROFIsafe V2 iPar
for 1 2-channel
output
(fieldbus to output)
for 1 input pair
(input to fieldbus)
for 2 input pares and
4 2-channel outputs
(input to fieldbus and
fieldbus to output)
for 1 2-channel
output
(fieldbus to output)
for 1 input pair
(input to fieldbus)
for 2 input pares and
4 2-channel outputs
(input to fieldbus and
fieldbus to output)
WAGO-I/O-SYSTEM 750
SIL3
SIL3
Cat. 4/PL e
10 years
-5
8.30 × 10 (8.30 % of all PFD from
-3
10 at SIL3)
-5
7.49 × 10 (7.49 % of all PFD from
-3
10 at SIL3)
-5
8.55 × 10 (8.55 % of all PFD from
-3
10 at SIL3)
-9
1.91 × 10 (1.91 % of all PFH from
-7
10 at SIL3)
-9
1.71 × 10 (1.71 % of all PFH from
-7
10 at SIL3)
-9
2.02 × 10 (2.02 % of all PFH from
-7
10 at SIL3)
1 (1 error in the application does not
yet lead to a failure of the safety
equipment)
96 %
> 100 years