Two-Channel Safety Application, Proof Test Interval 20 Years; Table 18: Safety Parameters For 2-Channel Safety Applications - 20 Years - WAGO -I/O-SYSTEM 750 Manual

4fdi/4fdo 24v/2a profisafe v2 ipar, fail-safe 4/4 channel digital input/output, 24 vdc, 2 a, profisafe v2.0 ipar
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WAGO-I/O-SYSTEM 750
750-667/000-003 4FDI/4FDO 24V/2A PROFIsafe V2 iPar
4.6.7.2

Two-channel Safety Application, Proof Test Interval 20 Years

Table 18: Safety Parameters for 2-Channel Safety Applications – 20 Years
Maximum safety integrity level
acc. EN 62061
Maximum safety integrity level
acc. IEC 61508
Maximum performance level
acc. EN ISO 13849-1
Proof test interval/usage duration
Probability of failure
*)
PFD
,
Proof test interval
20 years
(low demand mode)
(IEC 61508)
Probability of failure
*)
PFH
,
Proof test interval
20 years
(high demand mode)
(IEC 61508)
Hardware fault tolerance HFT with
two-channel application
(IEC 61508 / EN ISO 13849-1)
DC (diagnostic coverage level)
MTTF
d
(Mean Time To Failure dangerous)
*)
PFD: Probability of a dangerous failure on demand
PFH: Probability of a dangerous failure per hour
for 1 2-channel
output
(fieldbus to output)
for 1 input pair
(input to fieldbus)
for 2 input pares and
4 2-channel outputs
(input to fieldbus and
fieldbus to output)
for 1 2-channel
output
(fieldbus to output)
for 1 input pair
(input to fieldbus)
for 2 input pares and
4 2-channel outputs
(input to fieldbus and
fieldbus to output)
Version 1.4.2, valid from HW/SW Version 01/02
Device Description
SIL3
SIL3
Cat. 4/PL e
20 years
-4
1.66 × 10
(16.6 % of all PFD from
-3
10
at SIL3)
-4
1.50 × 10
(15.0 % of all PFD from
-3
10
at SIL3)
-4
1.71 × 10
(17.1 % of all PFD from
-3
10
at SIL3)
-9
1.92 × 10
(1.92 % of all PFH from
-7
10
at SIL3)
-9
1.72 × 10
(1.72 % of all PFH from
-7
10
at SIL3)
-9
2.02 × 10
(2.02 % of all PFH from
-7
10
at SIL3)
1 (1 error in the application does not
yet lead to a failure of the safety
equipment)
96 %
> 100 years
39
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