Sun Microsystems Enterprise 250 Owner's Manual page 245

Variable Setting
diag- 0
verbosity
1
2
4
8
OBDiag Test Descriptions
The following table provides information about the tests available through OBDiag.
It provides the test name, a brief description of the test, and any special
considerations involved in running the test.
Test Name
SUNW,envctrltwo
@14,60000
ebus@1
ecpp
@14,3043bc
eeprom@14,0
Description
Prints one line that indicates the device being
tested and its pass/fail status.
Prints more detailed test status, which varies in
content from test to test.
Prints subtest names.
Prints debug messages.
Prints back trace of callers on error.
Description
Verifies that the fans are
operational. Checks that the
temperature in the enclosure and at
the CPUs does not exceed the
maximum allowable range. Also
tests the disk and front panel LEDs.
Tests the on-board ASIC that
interfaces the following devices
with the PCI bus: parallel port,
serial port, keyboard, mouse,
diskette drive, NVRAM, and the
environmental monitoring and
control system.
Tests parallel port I/O logic,
including internal and external
loopback tests.
Tests the NVRAM functionality.
Special Considerations
To run external loopback tests, you must have a
special passive loopback connector attached to
the parallel port. The variable diag-targets
must be set to loopback, device&loopback,
or device&loopback,3.
The Sun part number for the parallel port
loopback connector is 501-2965-01.
Chapter 11 Diagnostics and Troubleshooting
Default
0
227