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9.5.2
Configure advanced settings
1.
Click on the Advanced tab.
2.
Maintain the options according to the
explanations in in the following table:.
Option
Save device settings
# Pixel in x/y *
Low power mode
Calibrated wavelength(s) in nm *
Used wavelength in nm *
Magnification
Focal length of focusing optics in mm *
Tab. 9.4:
Options in the Device control > Advanced tab of the Single planes measuring mode
60
Explanation
All options marked with an asterisk in the Device control menu can be
saved in the EEPROM of the device.
These and other options for saving / loading configurations are descri-
bed in chapter 9.4.4 on page 53.
This option enables setting the resolution of the CCD sensor:
X Enter the number of pixels in the x-direction / y-direction in the input
field on the left / right.
This option is only relevant when performing a beam search (Find beam
option, see chapter 9.5.1 on page 57). We recommend activating it
for low power laser beams (< 1 W).
If this option is enabled, the following initial values are selected during
beam search
•
Filter level of the filter wheel: 0 (instead of 1 otherwise)
•
Integration time: 10 ms (instead of 1 ms otherwise).
X Set the check mark to enable the option.
X Select the calibrated wavelength in the drop-down list.
The values displayed correspond to the calibration points of the
measuring objective. The correct value should be selected before each
measurement to enable high measurement accuracy.
Use one of the following options to set the used wavelength of the laser:
X Enter a value in the input field.
X Use the slider below the input field.
This parameter must be distinguished from the factory calibrated wave-
length of the measuring objective. The exact value should be entered,
because it is used for calculating the significant beam quality factor M².
The wavelength used should approximately match the calibrated wave-
length. To enable high measurement accuracy, a pre configured accep-
tance range must be observed. For example, if the calibration point
1 064 nm is selected, measurements can be taken in a range between
1 030 and 1 100 nm with high measurement accuracy.
Hence the value from the Calibrated wavelength in nm option is au-
tomatically adopted in the input field if a new selection was made there.
If this value is replaced by an impermissible high / low value, the imper-
missible value is automatically overwritten with the maximum / minimum
permissible value.
This field displays the magnification of the measuring objective.
X Enter the focal length used by the focusing optics of the laser
system.
If several planes of a caustic have been measured, the caustic fit and the
entered focal length are used to calculate the raw beam diameter on the
focusing optics.
MSM+ HB
Revision 00 EN - 02/2022
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