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9.6.2
Advanced
The options listed below in alphabetical order are not available in all measuring modes.
1.
Click on the Advanced tab.
2.
Enter the options according to the
explanations in the following table.
X Data with (*) can be saved, see
chapter 9.4.6 „Saving options" on
page 36.
Option
# Pixel in x/y *
Arithmetic Average *
Calibrated wavelength(s) in nm *
Focal length of focusing optics in mm *
Locked area
Measuring tip
46
Explanation
The number of pixels determines the resolution of the measurement.
Enter the resolution in x-/y-direction in the corresponding input fields.
The default algorithm for averaging the plane measurements is Arithmetic
Average. Averaging over several measurements can be useful, for example,
when measuring a laser with significant power fluctuations.
X Select an algorithm from the drop-down list:
•
Arithmetic Average: The measured values for each pixel are added
together and divided by the number of planes.
•
Max. intensity per pixel: The values from all the measurements are
compared for each pixel and only the maximum value for each one is
displayed.
Max. Lines: The values from all the measurements are compared
•
for each line (meaning the line measured by the device in x-direction)
and only the maximum value for each one is displayed.
The "calibrated wavelength" is the wavelength at which the device has
been validated. This is stored in the device and is displayed in the LDS.
If several planes of a caustic have been measured, the caustic fit and the
entered focal length are used to calculate the raw beam diameter on the
focusing optics.
X Enter the focal length used by the focusing optics of the laser system.
With this option, a spatial restriction of the measuring range can be
defined in y- and z-direction. The defined restricted area is not entered by
the horizontal and vertical carrier.
Use one of the following options:
X Enter the locked area in the P1, P2, P3 input fields.
X Press the left mouse button and drag the red dots.
This option is described in chapter 9.5.1 „Define locked area" on page 37.
Documentation of the measuring tip used
With these options, the specifications of the measuring tip used can be
entered into the LDS for documentation of the measurements performed.
This option is described in chapter 9.5.3 „Entries for the measuring tip used"
on page 40.
Measuring with rotated measuring tip
1.
Click one of the < > buttons.
The illustration of the device rotates 180 degrees.
2.
Click the Save device settings button.
The window Rotated tip is displayed.
3.
Check the Acknowledge box and click OK.
This option is described in chapter 9.5.5 „Rotating the measuring tip" on
page 41.
FocusMonitor FM+
Revision 08 EN - 08/2023
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