Xerox WorkCentre Pro 423 Service Manual page 250

WorkCentre Pro 423/428
3.2.3 Built-in Test Pattern
With DocuCentre230/280, the Built-in Test Pattern can be printed out. This is used for
analyzing each board on image quality problems caused by boards.
l Built-in Test Pattern printing out procedure
1. Enter the diag (C/E) mode.
2. Bring up the Diagnostic menu and press the Chain Function button.
3. Press the Chain button and enter 23 of the chain code.
4. Press the Function button and enter the specific function code of the Test Pattern.
5. Press the Start button.
6. Select Tray and enter number to copy.
7. Press the Start button.
8. Press the Close button.
l Type and output unit of Built-in Test Pattern (600dpi)
Chain Function Test Pattern
No. No.
23 1 ANALOG ASIC TEST 3x3 Photo
23 6 Grid+Slanting lines (1BIT)
23 7 Grid+Slanting lines (4BIT)
23 8 Continuous gradation (Fast scan line 256
gradations) 3x3 Photo
23 9 Continuous gradation (Slow scan line 256
gradations) 3x3 Photo
23 10 Blank copies
23 11 Solid black copies
23 12 Grid pattern (1BIT)
23 13 Grid pattern (4BIT)
23 14 Grid+Slanting lines (1BIT)
23 15 Grid+Slanting lines (4BIT)
23 20 IOT TEST PRINT of black and white
horizontal streaks
23 21 Standard pattern with continuous gradation
in fast scan direction (256 gradations)
23 22 Dark pattern with continuous gradation in
fast scan direction (256 gradations)
23 23 Standard pattern with continuous gradation
in slow scan direction (256 gradations)
23 24 Dark pattern with continuous gradation in
slow scan direction (256 gradations)
23 25 Standard pattern with continuous gradation
in fast scan direction (64 gradations)
3-6
23
23
23
23
l Type and output unit of Built-in Test Pattern (400dpi)
Chain
No.
24
24
24
24
Output unit (board)
24
24
IIT/IPS (SD)
24
IIT/IPS (TIS)
IIT/IPS (TIS)
24
IIT/IPS (TIS)
24
IIT/IPS (TIS)
24
MCU/SW PWB
MCU/SW PWB
24
MCU/SW PWB
MCU/SW PWB
24
MCU/SW PWB
MCU/SW PWB
24
MCU/SW PWB
24
MCU/SW PWB
24
MCU/SW PWB
24
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
CHAPTER 3 IMAGE QUALITY TROUBLESHOOTING
3.2 Image Quality Specifications
26 Dark pattern with continuous gradation in
fast scan direction (64 gradations)
27 Standard pattern with continuous gradation
in slow scan direction (64 gradations)
28 Dark pattern with continuous gradation in
slow scan direction (64 gradations)
30 Paper feed alignment adjustment pattern
Function Test Pattern
No.
10 Blank copies
11 Solid black copies
12 Grid pattern (1BIT)
13 Grid pattern (4BIT)
14 Grid+Slanting lines (1BIT)
15 Grid+Slanting lines (4BIT)
20 IOT TEST PRINT of black and white
horizontal streaks
21 Standard pattern with continuous gradation
in fast scan direction (256 gradations)
22 Dark pattern with continuous gradation in
fast scan direction (256 gradations)
23 Standard pattern with continuous gradation
in slow scan direction (256 gradations)
24 Dark pattern with continuous gradation in
slow scan direction (256 gradations)
25 Standard pattern with continuous gradation
in fast scan direction (64 gradations)
26 Dark pattern with continuous gradation in
fast scan direction (64 gradations)
27 Standard pattern with continuous gradation
in slow scan direction (64 gradations)
28 Dark pattern with continuous gradation in
slow scan direction (64 gradations)
30 Paper feed alignment adjustment pattern
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
Output unit (board)
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB
MCU/SW PWB