Motorola DSP56309 User Manual page 306

the optional TRST signal. On the DSP56309, the debug event (DE) signal is provided for
use by the OnCE module; it is documented in Section 10ÑOn-Chip Emulation Module.
The signal functions are described in the following paragraphs.
11.2.1 Test Clock (TCK)
The TCK signal is used to synchronize the test logic.
11.2.2 Test Mode Select (TMS)
The TMS signal is used to sequence the test controllerÕs state machine. The TMS is
sampled on the rising edge of TCK, and it has an internal pull-up resistor.
11.2.3 Test Data Input (TDI)
Serial test instruction and data are received through the Test Data Input (TDI) signal.
TDI is sampled on the rising edge of TCK, and it has an internal pull-up resistor.
11.2.4 Test Data Output (TDO)
The TDO signal is the serial output for test instructions and data. TDO is tri-stateable
and is actively driven in the Shift-IR and Shift-DR controller states. TDO changes on the
falling edge of TCK.
11.2.5 Test Reset (TRST)
The TRST signal is used to asynchronously initialize the test controller. The TRST signal
has an internal pullup resistor.
MOTOROLA DSP56309UM/D
JTAG Port
JTAG Signals
11-5