Agilent Technologies Agilent E5250A User Manual page 277

Agilent technologies low leakage switch mainframe user's guide
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Step 5. Applies stress and characterizes the parameters
This step performs the following:
1. Applies the stress, Vdstr and Vgstr, to the valid devices.
Before running the SP_MUX_M program, you must determine the Vdstr (drain
stress voltage) by Id-Vds measurement (using setup file IDVD.MES), then edit
the SP_MUX_M program to input value of Vdstr. Refer to "Executing the
Program" on page 9-27.
2. Performs the interim characterization. This sets up the 4155/4156 by using the
PARAM.MES setup file, then measures the parameters (Idlin, Gmmax, Vtext
and Vtci) for each device.
3. Judges whether to terminate the stress/interim characterization cycle. This cycle
is terminated when total stress time reaches 100,000 sec or when there is no
device satisfies all of the following conditions:
Idlin value is within ±10 % of initial value.
Gmmax value is within ±10 % of initial value.
Vtext value is within ±20 mV of initial value.
Vtci value is within ±20 mV of initial value.
If none of these termination conditions has occurred, stress time (duration) is
increased, and these 3 steps are repeated. The default cumulative stress times are
defined in the program as follows. To change these cumulative stress times, refer
to "Modifying the Program" on page 9-35.
Stress
Stress time
cycle
1
10 sec
2
10 sec
3
30 sec
4
50 sec
5
100 sec
6
300 sec
7
500 sec
Agilent E5250A User's Guide, Edition 11
Cumulative
Stress
stress time
cycle
10 sec
8
20 sec
9
50 sec
10
100 sec
11
200 sec
12
500 sec
13
1000 sec
Executing Sample Programs
HCI Measurement Program
Cumulative
Stress time
stress time
1000 sec
2000 sec
3000 sec
5000 sec
5000 sec
10000 sec
10000 sec
20000 sec
30000 sec
50000 sec
50000 sec
100000 sec
9-21

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