Nortel DMS-100 Series Maintenance Manual page 71

ANI_COIN_FAIL
PARITY_TRAP_FAIL
BIC_ACT_TEST
POWER_CONVERTER_FAIL
BIC_CM_TEST
RINGING_FAIL
BIC_INHIBIT_TEST
RTM_CM_TEST
BIC_LA_TEST
RTTS_CM_TEST
BIC_LOOPAROUND
SANITY_TIMEOUT_FAIL
BIC_SCAN_TEST
SET_MSG_LOOPAROUND
DCC_LA_TEST
SUBCYCLE_LENGTH_FAIL
DS1_LOOPAROUND
SUBCYCLE_ORDER_FAIL
IUC_LA_TEST
TIMING_TEST
LC_COM_TEST
WRITE_PROTECT_FAIL
LCC_FAIL
ZERO_CROSSING_INT_FAST_FAIL
LCC_LOOPAROUND
ZERO_CROSSING_INT_SLOW_FAIL
MEMORY_TEST
Faults that occur on a BIC drawer affect call processing regardless of the
in-service unit that controls that drawer. The full in-service tests use the
DCC. Where takeover is justified, you must first determine that the fault is
not in the DCC.
If takeover occurs because of a reported drawer fault, the DCC is at fault.
The DCC is at fault even though the LCM fails the BIC tests.
DMS-100 Family OPAC Maintenance Manual XPM12 and up
Maintenance overview 1-55