Sun Microsystems Enterprise 250 Owner's Manual page 279

TABLE 12–3
Test Name Description
Verifies that the fans are
SUNW,envctrltwo
operational. Checks that the
temperature in the enclosure and at
@14,60000
the CPUs does not exceed the
maximum allowable range. Also
tests the disk and front panel LEDs.
Tests the on-board ASIC that
ebus@1
interfaces the following devices
with the PCI bus: parallel port,
serial port, keyboard, mouse,
diskette drive, NVRAM, and the
environmental monitoring and
control system.
Tests parallel port I/O logic,
ecpp
including internal and external
loopback tests.
@14,3043bc
Tests the NVRAM functionality.
eeprom@14,0
Tests diskette drive control logic
fdthree
and the operation of the drive. The
test does not differentiate among a
@14,3023f0
drive, media, or main logic board
error; if any of these fail, it reports
the diskette drive as the FRU.
Tests the on-board Ethernet logic,
network@1,1
including internal and external
loopback tests.
Special Considerations
To run external loopback tests,
you must have a special passive
loopback connector attached to the
parallel port. The variable
diag-targets must be set to
loopback, device&loopback, or
device&loopback,3.
The Sun part number for the
parallel port loopback connector is
501-2965-01.
A formatted diskette must be
inserted into the drive.
To run external loopback tests on
the TPE port, you must have a TPE
loopback connector attached to the
TPE port. The variable
diag-targets must be set to
loopback, device&loopback, or
device&loopback,3.
The Sun part number for the TPE
loopback connector is 501-4689-01.
Diagnostics and Troubleshooting
245