Performing a 32-bit test
DTEST(P)
These instructions take bit data at position specified by (s2) from device specified by (s1) and write to bit device specified by
(d).
Ladder diagram
(s1)
(s2)
(d)
FBD/LD
EN
ENO
s1
d
s2
Setting data
■Descriptions, ranges, and data types
Operand
Description
(s1)
Device number where bit data to be extracted is stored
(s2)
Position of bit data to be extracted
(d)
Bit device number where extracted bit data is to be stored
EN
Execution condition
ENO
Execution result
■Applicable devices
Operand
Bit
X, Y, M, L, SM,
F, B, SB, S
(s1)
(s2)
(d)
*1 T, ST, C cannot be used.
Processing details
• These instructions take bit data at position specified by (s2) from device specified by (s1), (s1) +1 and write to bit device
specified by (d).
(1)
b31
∙∙∙
b21
∙∙∙
b16
(s1)+1
(1): (s2) bit (When (s2)=21)
• If relevant bit is "0", device specified by (d) is turned OFF, and if it is "1", device is turned ON.
• For (s2) specify the bit position (0 to 31) of double word data. If 32 or more is specified for (s2), the value of the remainder
of (s2)32 is the bit position.
Ex.
For (s2) = 34, the remainder for 3432 is "2", so it becomes data of b2.
Word
T, ST, C, D, W,
U\G
SD, SW, R
*1
b15
∙∙∙
b0
(s1)
Structured text
ENO:=DTEST(EN,s1,s2,d);
ENO:=DTESTP(EN,s1,s2,d);
Range
Data type
32-bit signed binary
0 to 31
16-bit unsigned binary
Bit
Bit
Bit
Double word Indirect
specification
Z
LC
LZ
(d)
Data type (label)
ANY32
ANY16
ANY_BOOL
BOOL
BOOL
Constant
Others
K, H
E
$
7 BASIC INSTRUCTIONS
7.4 Bit Processing Instructions
7
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