Performing A 32-Bit Test - Mitsubishi Electric MELSEC iQ-R Series Programming Manual

Performing a 32-bit test

DTEST(P)
RnPCPU
RnCPU RnENCPU
(Process)
These instructions extract the 'n'th bit in the specified double-word device.
Ladder
(s1)
FBD/LD
EN ENO
s1 d
s2
■Execution condition
Instruction
DTEST
DTESTP
Setting data
■Description, range, data type
Operand Description
(s1) Device where the extract target bit data is stored
(s2) Extract target bit position
(d) Device for storing the extracted bit data
EN Execution condition
ENO Execution result
■Applicable devices
Operand Bit
X, Y, M, L,
SM, F, B, SB,
FX, FY
(s1) 
(s2) 
(d) 
6 BASIC INSTRUCTIONS
346
6.4 Bit Processing Instructions
RnPCPU RnSFCPU RnSFCPU
(Redundant) (Standard) (Safety)
(s2) (d)
Execution condition
Word
J\ T, ST, C, D, W,
SD, SW, FD, R,
ZR, RD
 
 
 
ST
ENO:=DTEST(EN,s1,s2,d);
ENO:=DTESTP(EN,s1,s2,d);
Range

0 to 31



Double word Indirect
U\G, J\, Z LT, LST,
U3E\(H)G LC
  
  
  
Data type Data type (label)
32-bit signed binary ANY32
16-bit unsigned binary ANY16
Bit ANY_BOOL
Bit BOOL
Bit BOOL
Constant
specification
LZ K, H E
   
   
   
Others
$
 
 
 