Procedure; Double-Sided Spur - Agilent Technologies e1420b User Manual

Phase noise measurement system
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7
Residual Measurement Fundamentals

Procedure

1
Source
E5505a_syn_residual_measure
27 Feb 04 rev 1
Figure 156 Synthesized residual measurement using beatnote cal
2
3
4

Double-Sided spur

This calibration option has the following requirements:
• One of the input frequency sources must be capable of being phase
• The resultant sideband spurs from the phase modulation must have
• The offset frequency or modulation frequency must be between 10 Hz and
Advantages
• Requires only one RF source
• Calibration is done under actual measurement conditions so all
218
Connect circuit as per
o
O
power
splitter
Offset the carrier frequency of one synthesizer to produce a beatnote for
cal.
After the phase noise system reads the beatnote, set the software to the
same carrier frequency.
Adjust the phase difference at the phase detector to 90 degrees
(quadrature) either by adjusting the synthesizer or by adjusting an optional
variable phase shifter or line stretcher. Quadrature is achieved when the
meter on the front panel of the phase noise interface is set to zero.
modulated.
amplitudes that are –100 dB and –20 dB relative to the carrier amplitude.
maximum (See
the"Measured beatnote"
non-linearities and harmonics of the phase detector are calibrated out.
Figure 156
and tighten all connections.
Synthesizer 1
Optional line
Synthesizer 2
stretcher
on page 215).
Test set
Ref input
Phase
detector
Signal input
Agilent E5505A User's Guide

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