Single-Channel Safety Application, Proof Test Interval 20 Years; Table 18: Safety Parameters For Single-Channel Safety Application - 20 Years - WAGO -I/O-SYSTEM 750 Series Manual

WAGO-I/O-SYSTEM 750
753-661/000-003 4FDI 24V PROFIsafe V2 iPar
4.6.6.4

Single-channel Safety Application, Proof Test Interval 20 Years

Table 18: Safety Parameters for Single-Channel Safety Application – 20 Years
Maximum safety integrity level
acc. EN 62061
Maximum safety integrity level
acc. IEC 61508
Maximum performance level
acc. EN ISO 13849-1
Proof test interval/usage duration
Probability of failure
*)
PFD ,
Proof test interval
20 years
(low demand mode)
(IEC 61508)
Probability of failure
*)
PFH ,
Proof test interval
20 years
(high demand mode)
(IEC 61508)
Hardware fault tolerance HFT with single-
channel application
(IEC 61508 / EN ISO 13849-1)
DC (diagnostic coverage level)
MTTF
d
(Mean Time To Failure dangerous)
*)
PFD: Probability of a dangerous failure on demand
PFH: Probability of a dangerous failure per hour
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Manual
Version 1.4.0, valid from HW/SW Version 01/02
for 1 input (input to
fieldbus)
for 4 inputs (inputs
to fieldbus)
for 1 input (input to
fieldbus)
for 4 inputs (inputs
to fieldbus)
Device Description
SIL2
SIL2
Cat. 2/PL d
20 years
-4
1.62 × 10 (1.62 % of all PFD from
-2
10 at SIL2)
-4
2.01 × 10 (2.01 % of all PFD from
-2
10 at SIL2)
-9
1.85 × 10 (0.19 % of all PFH from
-6
10 at SIL2)
-9
2.30 × 10 (0.23 % of all PFH from
-6
10 at SIL2)
0 (1 error in the application can lead
to a failure of the safety equipment)
95 %
> 100 years
39