Safety Parameters; Two-Channel Safety Application, Proof Test Interval 10 Years; Table 15: Safety Parameters For 2-Channel Safety Applications - 10 Years - WAGO -I/O-SYSTEM 750 Series Manual

36 Device Description
4.6.6

Safety Parameters

4.6.6.1

Two-channel Safety Application, Proof Test Interval 10 Years

Table 15: Safety Parameters for 2-Channel Safety Applications – 10 Years
Maximum safety integrity level
acc. EN 62061
Maximum safety integrity level
acc. IEC 61508
Maximum performance level
acc. EN ISO 13849-1
Proof test interval/usage duration
Probability of failure
*)
PFD ,
Proof test interval
10 years
(low demand mode)
(IEC 61508)
Probability of failure
*)
PFH ,
Proof test interval
10 years
(high demand mode)
(IEC 61508)
Hardware fault tolerance HFT with two-
channel application
(IEC 61508 / EN ISO 13849-1)
DC (diagnostic coverage level)
MTTF
d
(Mean Time To Failure dangerous)
*)
PFD: Probability of a dangerous failure on demand
PFH: Probability of a dangerous failure per hour
753-661/000-003 4FDI 24V PROFIsafe V2 iPar
for 1 input pair
(input to fieldbus)
for 2 input pairs
(inputs to fieldbus)
for 1 input pair
(input to fieldbus)
for 2 input pairs
(inputs to fieldbus)
Version 1.4.0, valid from HW/SW Version 01/02
WAGO-I/O-SYSTEM 750
SIL3
SIL3
Cat. 4/PL e
10 years
-5
7.45 × 10 (7.45 % of all PFD from
-3
10 at SIL3)
-5
7.47 × 10 (7.47 % of all PFD from
-3
10 at SIL3)
-9
1.70 × 10 (1.70 % of all PFH from
-7
10 at SIL3)
-9
1.71 × 10 (1.71 % of all PFH from
-7
10 at SIL3)
1 (1 error in the application does not
yet lead to a failure of the safety
equipment)
95%
> 100 years
Manual