Limit Test Setup Dialog Box - Keysight B2980B Series User Manual

Front Panel Reference
Function Key Group
Values of GPIO Pins, /BUSY, /SOT, and /EOT
0 to 7 (integer). Numbers 1 to 7 indicate the DIO pins 1 to 7, respectively. 0
indicates that it is not used.
For GPIO Pins, multiple continuous pins are assigned. For example, "1, 2, 3, 4"
indicates that the DIO pins 1 to 4 are assigned. Then LSB is DIO pin 1.

Limit Test Setup Dialog Box

This dialog box provides the following parameters for setting the data
configuration of the limit test.
Feed Data
Test Index
Limit Test
Function
Pass Pattern
Up Pattern
Up Limit
Low Pattern
180
Type of data used for the pass/fail judgement of the limit test,
AMPS, COUL., VOLTS, OHMS, or MATH.
AMPS: Current measurement data
COULS.: Charge measurement data (B2985B/B2987B)
VOLTS: Voltage measurement data (B2985B/B2987B)
OHMS: Resistance data (B2985B/B2987B)
MATH: Calculation result data of math expression
Index of limit test, No. 1 to 12.
The index numbers 1 to 12 are associated with the bin numbers
1 to 12. See "Limit Test Result Dialog Box" on page
Limit test for data specified by the Feed Data and Test Index
parameters, ON or OFF
Test mode, LIMIT is always displayed.
Bit pattern for the limit test pass state. For the SORTING mode.
Bit pattern for the failed-by-exceeding-upper-limit state. Used
for the GRADING mode.
Upper limit for the pass/fail judgement. Used for the GRADING
mode.
Bit pattern for the failed-by-exceeding-lower-limit state. Used
for the GRADING mode.
Keysight B2980B User's Guide, Edition 1
185.