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Keysight B2900A Demo Manual
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Keysight B2900A Demo Manual

Keysight B2900A Demo Manual

Precision source/measure unit - making field effect transistor characterization using smu
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Keysight Technologies
Making Field Effect Transistor
Characterization Using SMU
B2900A Precision Source/Measure Unit
Demo Guide

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Summary of Contents for Keysight B2900A

  • Page 1 Keysight Technologies Making Field Effect Transistor Characterization Using SMU B2900A Precision Source/Measure Unit Demo Guide...
  • Page 2 SMU with the capability to output and measure both voltage and current. The B2900A SMU enables you to make a wide range of current versus voltage (IV) measurements more accurately and quickly than ever before. In addition, the...
  • Page 3 03 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide Measurement Concept An IV characteristics measurement of a field effect transistor is made based on the following: – Sourcing voltage from two channels to activate a transistor.

  • Page 4: Improper Connection

    (The FET Source, Gate and Drain are connected to 1, 2 and 3 respectively. If device has a substrate terminal, it is connected to 4.). 2. Put the N1294A-001 on the Ch 1 output terminals of the B2900A SMU. 3. Put the N1294A-001 on the Ch 2 output terminals of the B2900A SMU.
  • Page 5 05 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide LAB: Make Field Effect Transistor Characterization using SMU Demonstration Objective 1. Change View mode to Channel 1 Single View This demo explains how to make a...
  • Page 6 06 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 5) Press to change the keys shown in Assist keys, and then press to show Sweep Sub-Panel. 6) Press , then press to turn on Single Linear Sweep Mode. After turning on Single Linear Sweep Mode, you can see Source Shape which shows the single linear sweep mode.
  • Page 7 07 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 4. Configure the Channel 2 condition to source and measure 1) Press to edit the Source function then select to set the Source function to Voltage source.
  • Page 8 08 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 6) Then press to turn on the Single Linear Sweep Mode. After turning on the Single Linear Sweep Mode, you can see the Source Shape which shows single linear sweep mode.

  • Page 9: Perform The Measurement

    Now you can see the measurement result on the GUI of the B2900A SMU as below. 2) To change the Graph scaling of the Y-axis from LINEAR to LOG, rotate and press to select the Y-axis scaling.
  • Page 10 10 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 8. (Optional) Configure the measurement speed In the default setting, the instrument selects the appropriate measurement speed and range automatically to get the fine accuracy. However, you can also specify these parameters on the GUI of the B2902/12A to meet a variety of the requirement to the measurement conditions.
  • Page 11 11 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 9. (Optional) Configure the measurement range operation The parameters which configure the measurement range operation can be displayed in the Range Sub-panel in the Single View, although the Sweep Sub-Panel is shown at this moment.
  • Page 12 12 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 10. (Optional) Configure the measurement trigger delay time The trigger parameters including the measurement trigger delay time and the trigger period can be displayed in the Trigger Sub-panel in the Single View, although Range Sub-Panel is shown at this moment.
  • Page 13 13 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 5) Press repeatedly until the Channel 2 Single View is displayed. 6) Rotate and press to edit the Trigger type then select to set the Trigger type to SYNC.
  • Page 14 14 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide 11. (Optional) View the list of measurement results The measurement results can be viewed by following the steps below: 1) If you are not at the top of the Function menu, press repeatedly to return to the top level.
  • Page 15 15 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide Conclusion The Keysight’s B2900A Series Precision Source/Measure Unit (SMU) is a compact and cost-effective bench-top SMU with the capability to output and measure both voltage and current.
  • Page 16 16 | Keysight | Making Field Effect Transistor Characterization Using SMU – Demo Guide Evolving Since 1939 For more information on Keysight Technologies’ products, applications or Our unique combination of hardware, software, services, and people can help you services, please contact your local Keysight reach your next breakthrough.