Limit Test - Keysight B2980B Series User Manual

Femto/picoammeter electrometer/high resistance meter
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Limit Test

Limit test is a pass/fail judgment performed for a measurement data or math
result data obtained by a channel. It can be performed if both individual limit test
and composite limit test are set to ON. Maximum of twelve limit tests can be
defined and used for the bins of composite limit test.
Composite limit test supports the following two operation modes.
It also supports the following communication functionality via the Digital I/O
connector and can classify test devices using the component handler.
In the figures, SOT is the start-of-test strobe pulse sent by the component handler
connected to B2980 via the Digital I/O connector.
To set the composite limit test, see
page
To set the individual limit tests, see
The composite limit test result Pass or Fail is displayed with the measurement
result data on the Meter view. To display the limit test result log, see
Result Dialog Box" on page
Keysight B2980B User's Guide, Edition 1
Grading mode
Performs limit test for up to 12 test limits (bins) until a failure is detected. See
Figure 5-7
for an example flowchart.
Sorting mode
Performs limit test for up to 12 test limits (bins) until a pass is detected. See
Figure 5-8
for an example flowchart.
Receiving the SOT (start of test) strobe pulse
Transmitting the EOT (end of test) strobe pulse
Transmitting the BUSY signal
Transmitting the bit pattern to show a pass/fail judgement result
178.
"Composite Limit Test Setup Dialog Box" on
"Limit Test Setup Dialog Box" on page
185.
Function Details

Limit Test

180.
"Limit Test
229

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