Single-Sided Spur - Agilent Technologies E5500A User Manual

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8
Residual Measurement Fundamentals
Calibration Options

Single-Sided Spur

8-22
E5500 Phase Noise Measurement System Version A.02.00
NOTE: For the system to accept the adjustment to quadrature, the
meter must be within ± 2 mV to ± 4 mV.
7
Set the Type of Measurement to Phase Noise Without Using a
PLL.
8
Set the Calibration Technique to Derive From Double-sided Spur
and enter the sideband amplitude and offset frequency.
9
Select New Measurement.
10 Check quadrature and measure the phase detector constant by
pressing Y to proceed.
11 Remove audio source.
12 Reset quadrature and measure phase noise data.
This calibration option has the following requirements:
G
A third source to generate a single sided spur.
G
An external power combiner (or directional coupler) to add the
calibration spur to the frequency carrier under test. The
calibration spur must have an amplitude –100 dB and –20 dB
relative to the carrier amplitude. The offset frequency of the spur
must be 20 Hz and 20 MHz.
G
A spectrum analyzer or other means to measure the single sided
spur relative to the carrier signal.
You will find that the equipment setup for this calibration option is
similar to the others except that an additional source and a power
splitter have been added so that the spur can be summed with the
input carrier frequency.
Advantages:
Calibration is done under actual measurement conditions so all
non-linearities and harmonics of the phase detector are calibrated
out.
NOTE: The Single-sided Spur Method and the Double-sided Spur
Method (Option 4) are the two most accurate methods.
Document Part No. E5500-90024 Ed. 1.0

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