Tests; Ests Upplied; Standard Program Tests; Optional Program Tests - Voltech ATi User Manual

I
NTRODUCTION
1.4 T
ESTS
At the time of printing, the following tests are available for the ATi:

1.4.1 Standard Program Tests

1.4.2 Optional Program Tests

P 1-8
AGE
S
UPPLIED
CTY
R
RLS
RLP
LS
LP
LSB
LPB
C
QL
D
Z
ZB
ANGL
TR
IR
LL
LLO
R2
L2
C2
TRL
PHAS
GBAL
LBAL
Continuity
DC resistance
AC resistance – series circuit
AC resistance – parallel circuit
Inductance – series circuit
Inductance – parallel circuit
Inductance – series circuit with bias
Inductance – parallel circuit with bias
Interwinding capacitance
Quality factor
Dissipation factor (tanδ)
Magnitude of complex impedance
Complex impedance with bias
Angle of complex impedance
Turns ratio and phase (+ or -) by voltage
Insulation resistance
Leakage inductance
Leakage inductance with user offset
DC resistance match
Inductance match
Capacitance match
Turns ratio by inductance
Interwinding phase
General longitudinal balance
Longitudinal balance
V AT U
OLTECH I SER
M
ANUAL