Toshiba T3200 User Manual page 60

3.3 SUBTEST NAMES
The following table shows subtest name of the test program.
TABLE 3-1 Subtest Names
# TEST NAME SUBTEST#
TEST ITEMS
1 SYSTEM
01
ROM checksum
02 HW status
01
RAM constant data
02 RAM address pattern data
2 MEMORY
03 RAM refresh
04
Protected mode
05 Protected mode (3MB)
06 LIM (Expansion memory)
3
KEYBOARD
01 Pressed key display
02 Pressed key code display
01 VRAM read/write
02 Character attributes
03
Character set
04
80*25 Character display
4 DISPLAY
05 Graphics display (color set 0/1)
06
640*200 Graphics display
07 640*200 Graphics display
08 Display page
09
·W pattern display
10 Special attribute test
01 Sequential read
02 Sequential read/write
5 FDD 03 Random address/data
04 Write specified address
OS
Read specified address
01 Ripple pattern
6 PRINTER
02 Function
03 Wrapa around
01 Wrap around (channel· 1)
02
Wrap around (channel - 2)
03 Point to point (send)
7 ASYNC 04 Point to point (receive)
OS
Card modem loopback
06
Card modem on-line test
07 Dial tester test
01 Sequential read
02 Address uniquence
03
Random address/data
04 Cross talk & peek shift
8 HOD
OS
Write/read/compare(CE)
06 Write specified address
07 Read specified address
08 ECC circuit (CE cylinder)
09 Sequential write
01 Real time test
9 REAL TIMER 02 Backup memory test
03 Real ti me carry test
10 NDP 01 NDPtest
EXPANSION
01 Box wrap around test
11
UNIT
02
Box mono video ram test
03 Wrap around test ( 16bit bus)
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