Table of Contents
Advertisement
General Information
Clamp Test Setup
The DPT Clamp Test is similar to the Standard test but uses the Clamp Circuit
module (PD1000-66505). For accurate R
circuit limits the applied voltage level to the oscilloscope probe while the DUT is
turned off. This way an oscilloscope probe with a lower divider ratio (10:1) is used
to accurately measure V
Use these Double-Pulse Test Modules and Oscilloscope Probes
This Clamped DPT test uses the following Test Module and Oscilloscope Probes:
The Clamp Circuit Module provides the following:
22
DS
The maximum V
Clamp Circuit Module is 400 V. This for both IGBT and FET
devices.
Clamp voltage is fixed at 8 V. Refer to "Clamp Circuit Module" on
page 32.
– Any Keysight Isolated Low-Side and matching Isolated High-Side Gate
Drive Modules.
– Either the PD1000-60901 DUT Module for TO-247 3-pin devices,
PD1000-60902 DUT Module for TO-247 4-pin devices or the
PD1000-62401 DUT Module for D
– PD1000-66505 Clamp Circuit Module
– PD1000-60002 Protection Probe for measuring I
the Coaxial Shunt mounted on the DUT module.
– N2873 10:1 Standard Oscilloscope Probe for measuring V
Low-Side Gate Drive Module.
– N2873 10:1 Standard Oscilloscope Probe for measuring V
Clamp Circuit Module.
– 10076C 100:1 High Voltage Probe for measuring V
When installing or removing the PD1000-66505 Clamp Module,
you must cycle power on the PD1500A rack in order for the
change to be discovered.
– Clamps voltage to levels suitable for using the N2873A 10:1 passive probe
– Characterized systematic errors so that they can be taken into account
– Quantified achievable accuracy
measurements the clamping
(on)
DS
while the transistor is turned on.
or V
test voltage that may be applied to the
DS
CE
2
PAK (TO-263) SMD devices
Keysight Double-Pulse Test Fixture Installation and Use Guide
Clamp Test Setup
or I
. Probe connects to
D
C
or V
on the
GS
GE
on the
CLAMP
on the DUT Module.
DS
Advertisement
Table of Contents
