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General Information
The following Keysight oscilloscope probes are used:
Oscilloscope Probe
N2819A 10:1 Differential Probe
PD1000-60002
Protection Probe
N2873A 10:1 Standard Probe
10076C 100:1 High Voltage Probe
1 Environmental specifications for the PD1000-60002 Protection Probes:
- For indoor use only
- Operating Temperature: 20
- Storage Temperature (non-operating): -40
- Altitude: 3000 Meters (98,425 ft.)
- Humidity: Maximum Relative humidity 80% for temperatures up to 31
50% Relative Humidity at 40
- Pollution Degree 2
2 Requires Infiniium Oscilloscope Software for Windows 10, version 06.40 (or later) in the DSOS104 Oscilloscope.
A double-pulse test is a common method for characterizing Wide Band Gap
(WBG) power transistors. In general, it characterizes the turn-on and turn-off
behavior for different supply voltages and different current levels. Two power
transistors are configured in a totem-pole configuration. The Low-Side transistor
is referred to as the Device Under Test (DUT). For proper operation, the body
diode of the High-Side transistor is used only for the standard double-pulse test.
For a Reverse Recovery test, the High-Side transistor is switched and the body
diode of the Low-Side device is characterized.
20
PD1000A Test Fixture for the PD1500A Double-Pulse Test System
Used to measure
Gate Current, I
Source Current, I
1,2
Gate Voltage, V
and V
CLAMP
V
/V
DS
°
°
C to 30
C
°
C to 70
°
C – non-condensing.
Some IGBT devices do not have a integral body diode and
therefore cannot be used as a High-Side device for double-pulse
test measurements or as a DUT in for Reverse Recovery tests.
When a device such as this is used, the test becomes similar to an
avalanche test and the device is destroyed.
Some devices may have a very weak body diode with a peak
current rating well below the current rating of the transistor.
These devices may be used for the free-wheeling diode as long as
the test current remains below the rating of the body diode. For
higher currents, use transistors or discreet diodes with suitable
high current ratings.
Used with
Low-Side Gate Drive Module
G
/I
Coaxial Shunt on DUT Module
D
C
See "Coaxial Shunt Resistor and
PD1000-60002 Protection Probe" on
page 41
/V
Low-Side Gate Drive Module and
GS
GE
Clamp Module
DUT Module
CE
See "Connect the 10076C High Voltage
Probe" on page 40
°
C
°
C decreasing linearly to
Keysight Double-Pulse Test Fixture Installation and Use Guide
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