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Standard Double-Pulse Test Setup
Standard Double-Pulse Test Setup
A Standard Double-Pulse Test is a common method for characterizing WBG
power transistors. In general, it characterizes the turn-on and turn-off behavior
for different supply voltages and different current levels. Two power transistors
are configured in a totem-pole configuration (also called a half-bridge
configuration). The Low-Side transistor is referred to as the Device Under Test
(DUT). For proper operation, the body diode of the High-Side transistor is
mandatory and is also used for the Reverse Recovery Test.
Use these Double-Pulse Test Modules and Oscilloscope Probes
The Standard DPT test uses the following Test Modules and Oscilloscope Probes:
Keysight Double-Pulse Test Fixture Installation and Use Guide
– Any Keysight Isolated Low-Side and matching Isolated High-Side Gate
Drive Modules.
– Either the PD1000-60901 DUT Module for TO-247 3-pin devices,
PD1000-60902 DUT Module for TO-247 4-pin devices or the
PD1000-62401 DUT Module for D
– N2819A 10:1 Differential Probe for measuring Gate Current, I
– PD1000-60002 Protection Probe for measuring I
– N2873 10:1 Standard Probe for measuring V
Module.
– 10076C 100:1 High Voltage Probe for measuring V
– IMPORTANT: Remove the PD1000-66505 Clamp Module before running a
Standard or Reverse Recovery DPT Test.
When installing or removing the PD1000-66505 Clamp Module,
you must cycle power on the PD1500A rack in order for the
change to be discovered.
2
PAK (TO-263) SMD devices
.
D
on the Low-Side Gate Drive
GS
on the DUT Module.
DS
General Information
.
G
21
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