HP StorageWorks 2/64 - Core Switch Command Reference Manual page 75

Chip number error subtest
The forced bad chip number error subtest verifies that the bad buffer number in the data packet can be
detected and its error flag and interrupt bits set.
The test method is as follows:
1. Clear the error and interrupt bits of all ASICs.
2. Set up the hardware so that transmission of data includes a bad buffer.
3. For each of the 11 possible offsets for each ASIC X in the switch:
a. Write a 64-byte pattern in the central memory.
b. Read X from all ASIC Y in the switch.
c. For all ASIC Y, ensure:
• interrupt status bits set.
• the error type is chip number error.
• the port number in error is the receiver port (which is the base port of ASIC Y).
Reading the error register clears the CMEM interrupt bit, preparing for the next offset to test.
Operands
This command has the following operands:
--slot slotnumber
-passcnt count
-datatype type
-ports itemlist
-seed value
Specify the slot number on which the diagnostic will operate.
The ports specified will be relative to this slot number. The
default is set to 0 and designed to operate on fixed port-count
products.
Specify the number of test passes to run. By default, the test runs
one time.
Specify the type of data pattern to use. By default, type 9,
QUAD_RAMP, is used. For a complete list of supported data
patterns, run the
dataTypeShow
settings are:
1 BYTE_FILL pattern
2 WORD_FILL pattern
3 QUAD_FILL pattern
9 QUAD_RAMP (Addr=Data) pattern
11 RANDOM pattern
Specify a list of blade ports to test. The Ports list is translated into
a matching Quad list before the test is run. By default, all the
blade ports in the specified slot (--slot) are tested. See
for more information.
itemList
Specify the data pattern seed to be used. The default seed value
is 0.
command. Some common
Fabric OS 5.x command reference guide 75