Cis Sub Regist - Konica Minolta bizhub C25 Service Manual

Field Service Ver. 1.1 May 2011
13.4.4

CIS SUB REGIST

A. Use
• To adjust for variations in the accuracy of IR parts and their mounting accuracy by vary-
ing the scanning start position in the sub-scanning direction.
• When the original glass is replaced.
• When the Scanner unit has been replaced.
NOTE
• After the [CIS SUB ZOOM] adjustments have been performed.
• Adjust the width of C in the copy of the test pattern1 so that the following specification is
met.
• 20 ± 2.5 mm
B. Procedure
• The default setting is 0.
-5.0 (-5.0 mm) ~ "0 (0 mm)" ~ +5.0 (+5.0 mm); Step: 0.5 mm
1. Print the test pattern1.
See P.155
2. Enter the [ADJUST] menu in the service mode.
3. Select [CIS SUB REGIST] of [ADJUST] and press the Select key.
4. Place the test pattern1 on the original glass and make a test copy.
NOTE
• The test pattern1 should be positioned vertically.
• Use A4 or Letter paper loaded into tray1 to make the test copy.
5. Check that the width of C in the copy of the test pattern are shifted.
If the width of C is out of specification, adjust it according to the following procedure.
6. Press the Select key.
7. Using the / key, change the setting value and then press the Select key.
8. Place the test pattern1 on the original glass. Then, make a test copy again and check it.
<Adjustment instructions>
If the width of C in the test pattern is longer than the specified width.. Increase the setting.
If the width of C in the test pattern is shorter than the specified width.. Decrease the setting.
C
13. SERVICE MODE
4139F3C547DA
139