Section 11
Device and functionality tests
296
Description
•
Differential mode
•
Common mode
Emission tests
•
Radiated
30...230 MHz
230...1000 MHz
•
Conducted
0.15...0.50 MHz
0.5...30 MHz
1) When SCM is configured as a generic I/O, the level supported is ±2 kVp (L-Gnd) ±1 kVp (L-L)
Table 208:
Electromagnetic compatibility and immunity tests according to ANSI standards
Description
1 MHz oscillatory SWC test
Fast transient SWC test
Radio frequency interference
tests
Electrostatic discharge test
Table 209:
Mechanical tests
Description
Vibration tests (sinusoidal)
•
Vibration response test
•
Vibration endurance test
Shock and bump test
•
Shock response test
Table continues on next page
Type test value
150 V (RMS)
100 Ω coupling resistor
0.1 μF coupling capacitor
300 V (RMS)
220 Ω coupling resistor
0.47 μF coupling capacitor
<40 dB (μV/m) quasi-peak,
measured at 10 m distance
<47 dB (μV/m) quasi-peak,
measured at 10 m distance
<79 dB (μV) quasi-peak
<66 dB (μV) average
<73 dB (μV) quasi-peak
<60 dB (μV) average
Type test value
All ports:
±2.5 kV common mode/
differential mode
All ports:
±4 kV common mode/differential
mode
20 V/m (prior to modulation)
f = 80...1000 MHz (AM)
f = 900 MHz (PM)
±15 kV air discharge
Type test value
Class 1
f = 10...150 Hz
Peak acceleration: 0.5 g
1 sweep cycle in each axis
f = 10...150 Hz
Peak acceleration: 1.0 g
20 sweep cycles in each axis
Class 1
Peak acceleration: 5 g
Duration of the pulse: 11 ms
Number of pulses in each
direction: 3
Installation and Commissioning Manual
1MRS757488 H
Reference
IEC 60255-26
Reference
IEEE C37.90.1-2002
IEEE C37.90.1-2002
IEEE C37.90.2-2004
IEEE C37.90.3-2001
Reference
IEC 60255-21-1
IEC 60255-21-2
RIO600