Sun Microsystems Netra T4 AC100 Service And System Reference Manual page 240

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CODE EXAMPLE E-1
{0}Test data reliability
{0}Test address line transitions
{0}* I-Cache Snoop Tags
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* I-Cache Init
{0}* D-Cache RAM
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* D-Cache TAGS
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
E-8
Netra T4 AC100/DC100 Service and System Reference Manual • August 2001
diag-level Variable Set to max (8 of 17)
{1}Test data reliability
{1}Test address line transitions
{1}* I-Cache Snoop Tags
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* I-Cache Init
{1}* D-Cache RAM
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* D-Cache TAGS
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* D-Cache MicroTags

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