Sun Microsystems Netra T4 AC100 Service And System Reference Manual page 239

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diag-level Variable Set to max (7 of 17)
CODE EXAMPLE E-1
{0}Test data reliability
{1}Test data reliability
{0}Test address line transitions
{1}Test address line transitions
{0}* Ecache Address Line
{1}* Ecache Address Line
{0}* Partial Ecache Init
{1}* Partial Ecache Init
{0}* BBC E-Star Registers
{1}* I-Cache RAM
{0}* I-Cache RAM
{1}Test address up
{0}Test address up
{1}Test address down
{0}Test address down
{1}Test cell disturbance
{0}Test cell disturbance
{1}Test data reliability
{0}Test data reliability
{1}Test address line transitions
{0}Test address line transitions
{1}* I-Cache TAGS
{1}Testing I-Cache Tag
{0}* I-Cache TAGS
{1}Test address up
{0}Testing I-Cache Tag
{0}Test address up
{1}Test address down
{0}Test address down
{1}Test cell disturbance
{0}Test cell disturbance
{1}Test data reliability
{0}Test data reliability
{1}Test address line transitions
{0}Test address line transitions
{1}Testing I-Cache Micro Tag
{1}Test address up
{0}Testing I-Cache Micro Tag
{0}Test address up
{1}Test address down
{0}Test address down
{1}Test cell disturbance
{0}Test cell disturbance
Appendix E Example POST Diagnostic Output
E-7

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