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Stratasys J850/J835 User Guide
Close
Click to close the Built-in Tests screen.
Summary
On the right side of the screen, a symbol represents the combined results of all
the tests run, using the symbols from the Status column.
Test Descriptions and Troubleshooting
The following table lists the name of each test in the Built-in Tests suite,
together with its description and a possible reason for its failure. If you need
assistance, contact your Stratasys service provider.
Test Name
FIFO Non-Interrupt/
FIFO Interrupt
System Info
Parameter Sanity
Check
RFID
Sub-System
Communications
Cabin Temperature
DOC-18001 Rev. N
All tests successfully completed.
At least one test failed.
Not all tests performed.
Description
• Tests the data queue in the
DATA PCI card.
• Tests the Windows interrupt.
Compares the following parameter
values with the minimum
requirements.
• physical memory
• available memory
• free space on disk
• monitor resolution
Compares the values of all printer
parameters (in cfg files) to the
required values.
Verifies the presence of RFID tags
on material cartridges, and tests
them (by writing data to the tag and
then reading it).
Tests communication between
printer components.
Tests the temperature level in the
build-tray area.
4 Operating and Maintaining the Printer
Possible Reason for Failure
• If both FIFO tests fail:
Faulty DATA_PCI card.
• If only the FIFO Interrupt test fails:
Faulty Windows interrupt.
Failure of RAM memory allocation in
the printer computer.
One or more of the printer parameters
is not within the required range.
Details appear in the BIT report.
• Faulty RFID reader.
• Faulty RFID reader power supply.
• Faulty or misaligned RFID tag.
• High level of electromagnetic
noise around the RFID tag.
• Disconnected communications
cable.
• Faulty cable.
• Faulty temperature sensor
(OHDB).
• Failure of exhaust fan.
• Clogged exhaust filter.
4-140
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