Testing Performance - Agilent Technologies 1670G Series Service Manual

3
To perform the self-tests 3-3
To make the test connectors (logic analyzer) 3-7
To test the threshold accuracy (logic analyzer) 3-9
To test the single-clock, single-edge, state acquisition (logic analyzer) 3-17
To test the multiple-clock, multiple-edge, state acquisition (logic analyzer) 3-29
To test the single-clock, multiple-edge, state acquisition (logic analyzer) 3-41
To test the time interval accuracy (logic analyzer) 3-53
To test the CAL OUTPUT ports (oscilloscope) 3-59
To test the input resistance (oscilloscope) 3-63
To test the voltage measurement accuracy (oscilloscope) 3-67
To test the offset accuracy (oscilloscope) 3-71
To test the bandwidth (oscilloscope) 3-76
To test the time measurement accuracy (oscilloscope) 3-81
To test the trigger sensitivity (oscilloscope) 3-85
Performance Test Record (logic analyzer) 3-89
Performance Test Record (oscilloscope) 3-92
Performance Test Record (pattern generator) 3-95

Testing Performance