Appendix C - Device Test Mode; Device Mode Configuration; Device Test Mode Pin Configuration - Texas Instruments TLK3134 Data Manual

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C APPENDIX C – Device Test Mode
This device can be placed into one of the three modes: functional mode including JTAG testing mode,
scan testing mode, and Jadis/eFuse testing mode. The scan testing mode and Jadis/eFuse testing modes
are for TI use only, and may be ignored by external users of this device.
FUNCTIONAL DEVICE PIN
NAME
TESTEN
GPI1
FUNCTION
FUNCTIONAL MODE
AL DEVICE
SIGNAL DIRECTION
PIN NAME
SPEED1 I
SPEED0 I
PLOOP I
SLOOP I
PRBS_EN I
CODE I
TDI I
PRTAD4 I
PRTAD3 I
PRTAD2 I
PRTAD1 I
PRTAD0 I
GPO0 O
GPO1 O
GPO2 O
GPO3 O
GPO4 O
Copyright © 2007–2009, Texas Instruments Incorporated
Table C-1. Device Mode Configuration
FUNCTIONAL MODE/JTAG TESTING
0 or 1
0
Table C-2. Device Test Mode Pin Configuration
TEST
MODE FUNCTIONAL
SIGNAL MODE/JTAG TESTING
DIRECTION
I SPEED1
I SPEED0
I PLOOP
I SLOOP
I PRBS_EN
I CODE
I
I PRTAD4
I PRTAD3
I:
Jadis/eFuse PRTAD2
O: Scan
I PRTAD1
I PRTAD0
O TEST_DOUT0
O TEST_DOUT1
O TEST_DOUT2
O TEST_DOUT3
TEST_DOUT4 or JC PLL
O
Digital Test Out
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SLLS838F – MAY 2007 – REVISED DECEMBER 2009
SCAN MODE
0
1
SCAN MODE
Scan In 5
Scan In 4
Scan In 3
Scan In 2
Scan In 1
Scan Enable
Adaptive Scan Enable
TDI
(Test Mode)
Scan HS Enable
(Transition Fault)
Scan Clock
Scan Out 5
Scan Clock Select (0: from
device pin, 1: from Jadis),
also EFUSE_SYS_CLK
HSTL Force Down
Scan Out 4
Scan Out 3
Scan Out 2
Scan Out 1
Burnin_Output
APPENDIX C – Device Test Mode
TLK3134
TLK3134
Jadis/eFuse MODE
1
1
Jadis/eFuse MODE
STCI_D
EFUSE_TMS
EFUSE_TDI
STCICFG1
EFUSE_INITZ
TESTCLK_T
JADIS_EFUSE_SEL
TESTCLK_R
STCICLK
STCICFG0
EFUSE_SYS_CLK
EFUSE_TCK
Tied LOW
Tied LOW
STCI_Q
EFUSE_TDO
Burnin_Output
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