Efuse_Control; Serial Side Data/Clock Pins; Miscellaneous Pins - Texas Instruments TLK3134 Data Manual

4-channel multi-rate transceiver
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TLK3134
SLLS838F – MAY 2007 – REVISED DECEMBER 2009
SIGNAL
LOCATION
U8
U7
TDP3/TDN3
R6
TDP2/TDN2
R7
TDP1/TDN1
U5
TDP0/TDN0
U4
R3
R4
U13
U14
RDP3/RDN3
R13
RDP2/RDN2
R12
RDP1/RDN1
U10
RDP0/RDN0
U11
R10
R9
SIGNAL
LOCATION
D11
VPP
E11
TESTEN
M6
AMUX1
T12
AMUX0
T6
C14
H15
RES[4:1]
G2
C4
GPI1
R2
J6
K6
GPO[4:0]
L6
L3
N1
108
Device Reset Requirements/Procedure
Table 3-5. Serial Side Data/Clock Pins
VOLTAGE
TYPE
AVDD
CML Output
AVDD
CML Input
Table 3-6. Miscellaneous Pins
VOLTAGE
TYPE
DVDD
P
LVCMOS 2.5 V
VDDO
Input
VDDA
Analog Output
VDDA
Analog Output
Resistive
VDDQ
Connection
LVCMOS 2.5 V
VDDO
Input
LVCMOS 2.5 V
VDDO
Output
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DESCRIPTION
Transmit Differential Pairs, XAUI Lane, High speed serial outputs. The
data rate of these signals is from 600 Mbps minimum to 3.75 Gbps
maximum.
Receive Differential Pairs, XAUI Lane, High speed serial inputs with
on-chip 100 ohm differential termination. Each input pair is terminated
differentially across an on chip 100 ohm resistor. The data rate of
these signals is from 600 Mbps minimum to 3.75 Gbps maximum.
DESCRIPTION
Efuse Controller Voltage (1.2 V). Must be tied to 1.2 V (DVDD) in the
system application.
Test Mode Enable Input – Must Be Grounded in the System
Application.
SERDES Analog Mux 1 RX – Must be Unconnected/Open in the
System Application
SERDES Analog Mux 0 TX – Must be Unconnected/Open in the
System Application
HSTL Impedance Control Resistors – 0.5% Tolerance Resistor
required of the following values:
150 Ohms between RES4 and GND
150 Ohms between RES3 and GND
50 Ohms between RES2 and GND
50 Ohms between RES1 and GND
Note: These resistors cannot be shared between output pins.
General Purpose Input – Must be Grounded in the System
Application.
General Purpose Outputs – Must be Unconnected/Open in the
System Application.
It is recommended that these output ports go to headers or
non-populated resistor pads to facilitate probing of internal device
functions/settings during the initial system bring up process.
Also, to monitor PRBS testing real time, these outputs must be
available for probing on the application board.
Copyright © 2007–2009, Texas Instruments Incorporated
TLK3134
www.ti.com

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