Viewing Virtual Circuit Statistics; Viewing Virtual Circuit Statistics By Circuit - 3Com 3C63100-AC-C - PathBuilder S600 Bridge/router Reference Manual

Viewing Virtual Circuit
Statistics
SEFS—The number of severely errored framing seconds (SEFSs) encountered by
the FAM interface.
UAS—The number of unavailable seconds (UASs) encountered by the FAM
interface.
CSS—The number of controlled slip seconds (CSSs) encountered by the FAM
interface.
PCV—The number of path coding violations (PCVs) encountered by the FAM
interface.
LES—The number of line errored seconds (LESs) encountered by the FAM
interface.
BES—The number of bursty errored seconds (BESs) encountered by the FAM
interface.
DM—The number of degraded minutes (DMs) encountered by the FAM interface.
LCV—The number of line coding violations (LCVs) encountered by the FAM
interface.
The virtual circuit statistics available for the PathBuilder S600 provide you with
circuit parameters and cell counts broken down in two ways:
by circuit
n
by port/group
n
These statistics enable you to look at cell loss at various points in the data flow and
adjust parameters—such as shaper values—accordingly.

Viewing Virtual Circuit Statistics by Circuit

To display virtual circuit statistics by circuit, follow these steps:
1 From the Configuration Management menu, select [2] Manage Circuits to display
the Virtual Circuit menu.
2 From the Virtual Circuit menu select [5] Show Virtual Circuit Statistics to display a
summary of statistics for all circuits, as shown in Figure 160.
Viewing Statistics 215