Omicron CT SB2 User Manual page 70

CT Analyzer User Manual
Table 6-1: Setting Menu options (continued)
Option
Select Customized
Assessment
Temperature
Date/Time
Display Contrast
Accur. Limiting Error
Graph
Start Delay
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Description
CT Analyzer offers the possibility to customize the automatic test
assessment of the Advanced CT Test mode according to your needs by
applying your own assessment rules (so-called customized assessment
configurations) instead of the predefined assessment rules based on the
class definitions stated in the IEC and IEEE standards.
You can create such customized assessment rules in CT Analyzer Suite
and then send them to your CT Analyzer test set (Save as -> Send to
CT Analyzer). CT Analyzer Suite by default stores such customized
assessment rules (*.car files) to the OMICRON/CAR folder on the
Compact Flash card of CT Analyzer.
Press the Select File soft key to select a customized assessment rule file
stored on the Compact Flash card of your CT Analyzer. The customized
assessment rule selected is offered for selection in the Standard field of
the CT-Object card.
Use the Disable soft key to clear your selection.
Note: The guesser function is not available if you use a customized
assessment configuration instead of a standard.
Select the temperature unit (°C or °F) and the default values for the
ambient temperature and the reference temperature (for winding
resistance measurement and calculation).
Clock settings for the device-internal clock. Select a field using the cursor
keys, enter the value, and press Set to apply your changes.
Display contrast adjustment.
Enable or disable the accuracy limiting error graph.
This graph is primarily required for Chinese standards. It shows the
maximum possible primary current (K * I
burden without exceeding the accuracy limit (5% or 10%).
Allows the definition of a delay time of up to 10s for the actual test start
after pressing the start button.
You can apply the defined delay for the burden test, the residual
magnetism measurement, the primary winding resistance measurement
and the secondary winding resistance measurement.
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OMICRON