Omicron CT SB2 User Manual page 122

Ct analyzer
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CT Analyzer User Manual
Table 8-20: Test results for IEC 61869-2 (continued)
Param.
Description
E-max
Maximum e.m.f. voltage.
This parameter allows the determination of the working
point on the excitation curve that would be reached with the
entered settings.
Peak instantaneous error at voltage E
^
ε
Peak alternating error component acc. to the standard.
^
ε ac
1. If CT Analyzer is not able to measure up to the actual value, the prefix ">" is displayed to indicate that the measurement value
is larger than the displayed value.
2. If parameter "Spec." is set to "by Duty" in the CT-Object card (see page 101), no calculation is performed for this parameter if
the user did not specify values for T
3. This parameter is only displayed if parameter "Spec." is set to "by Duty" in the CT-Object card (see page 101). No calculation
is performed for this parameter if the user did not specify values for T
Test results displayed in the Excitation card for IEEE C57.13
Table 8-21: Test results for IEEE C57.13
Param.
V-kn
I-kn
Ls
Lm
Ts
Kr
1
Vs (10% RE)
2
Vs (User def. % RE)
FS
FSi
1. For IEEE C57.13 classes C, T and K.
2. For IEEE C57.13 class X only.
3. If CT Analyzer is not able to measure up to the actual value, the prefix ">" is displayed to indicate that the measurement value
is larger than the displayed value.
120
and t
in the CT-Object card prior to the test.
p
al1
Description
Knee point voltage according to standard.
Knee point current according to standard.
Saturated inductance.
Non-saturated inductance.
Secondary time constant.
Remanence factor.
Terminal voltage at 10 % ratio error.
Terminal voltage at the user-defined percentage of the
ratio error specified for the RE(20*Isn) parameter in the
CT-Object card.
Instrument security factor (direct measurement method),
calculated for nominal and operating burden.
Instrument security factor (indirect measurement
method), calculated for nominal and operating burden.
Results displayed for
IEC 61869-2
protection CTs, class
.
max
and t
in the CT-Object card prior to the test.
p
al1
3
x
x
x
x
x
Results displayed for
IEEE C57.13
protection
metering
CTs
CTs
x
x
x
x
x
x
x
x
x
x
x
x
1
x
2
x
x
x
1
OMICRON

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