Omicron CT SB2 User Manual page 107

Specific parameters and settings displayed for IEEE C57.13 protection CTs
The following parameters are only displayed in the CT-Object card if the IEEE C57.13 standard is
selected with the type "Prot. CT".
Table 8-10: Parameters and settings for IEEE C57.13 protection CTs
Param. Description
Vb * Rated secondary terminal voltage.
If the IEEE C57.13 standard is selected with the type "protection CT"
(class C, K or T), the VA and Cos
the user. In this case, the user has to enter the terminal voltage V
instead.
Possible values: Integer values from 10 to 2000V or soft keys ?
10V, 20V, 50V, 100V, 200V, 400V, 800V or 1600V
Default: ? or ?*.
* This parameter is relevant for assessment. No automatic
assessment is available if the user did not enter data for this
parameter prior to the test.
Burden After selecting the terminal voltage Vb (see above) using one of the
designation available soft keys, this field displays the corresponding standard
burden designation, for example, B-1.0. The burden designation is
calculated automatically by CT Analyzer. If you enter a Vb value not
offered by the soft keys, CUSTOM is displayed in this field to indicate
that the burden selected is not defined in the standard.
RE(20*Isn) Ratio error at 20 * I
Possible values: Integer values from 1% to 20%.
Default: 10%.
Vk User-defined measuring point.
Vk1 User-defined measuring point 1.
Possible values: Integer values from 0.1V to 20.000V or soft key ?
Default: ?.
Ik User-defined measuring point.
Ik1 User-defined measuring point 1.
Possible values: Integer values from 0.03mA to 30.000mA or soft
2
key ? .
Default: ?.
Rct Specified secondary winding resistance.
Possible values: 0 to 3000 ohms or soft key ?
Default: ?
1. Acc. to IEEE C57.13 (2008)
2. If the question mark is entered for this parameter and a new test is started, CT Analyzer automatically tries to determine the
value using its integrated guesser function (see chapter 9 on page 138).
OMICRON
ϕ
parameters are not accessible to
.
sn
Test cards for Advanced CT Test mode
b
2
,
2
.
2
.
Available for
IEEE C57.13, class
1
C T X K
x x x
x x x x
x
x x
x x
x
105