Omicron CT SB2 User Manual page 121

Test results displayed in the Excitation card for IEC 61869-2
Table 8-20: Test results for IEC 61869-2
Param. Description
V-kn Knee point voltage according to standard.
I-kn Knee point current according to standard.
Ls Saturated inductance.
Lm Non-saturated inductance.
Ts Secondary time constant.
Kr Remanence factor.
ε
Indirect error (acc. to standard).
i
FS Instrument security factor according to IEC 61869-2 direct
measurement method, calculated for nominal and operating
1
burden.
FSi Instrument security factor according to IEC 61869-2 indirect
measurement method, calculated for nominal and operating
1
burden.
ALF Accuracy limiting factor according to IEC 61869-2 direct
measurement method, calculated for nominal and operating
1
burden.
ALFi Accuracy limiting factor according to IEC 61869-2 indirect
measurement method, calculated for nominal and operating
1
burden.
Kx Dimensioning factor (acc. to IEC 61869-2) at accuracy limit
with the selected load.
Ek Accuracy limiting voltage according to IEC 61869-2 (that
point on the excitation graph where an increase of the e.m.f.
r.m.s. voltage (core flux) by 10% causes an increase of the
r.m.s. current by 50%).
Ie Accuracy limiting current according to IEC 61869-2 (at Ek).
E1 User-defined e.m.f. to verify the excitation current at this
e.m.f.
Ie1 Max. allowed excitation current at E
Kssc Rated symmetrical short-circuit current factor at accuracy
limit with the selected load.
Ktd
Theoretical transient dimensioning factor.
OMICRON
Test cards for Advanced CT Test mode
.
1
1, 2
3
Results displayed for
IEC 61869-2
protection CTs, class
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x
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x
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