Test Functions; Registers Controlling The Test Function; Basic Configuration Of Test Function; Test Input Factors - NEC PD78052 User Manual

21.5 Test Functions

Upon occurrence of watch timer overflow and the detection of the falling falling edge of port 4, the corresponding
test input flag is set (1) and a standby release signal is generated. Unlike in the case of interrupt functions, vector
processing is not performed.
There are two test input sources as shown in Table 21-5. The basic configuration is shown in Figure 21-18.
Name
INTWT
INTPT4

21.5.1 Registers controlling the test function

The test function is controlled by the following three registers.
• Interrupt request flag register 1L (IF1L)
• Interrupt mask flag register 1L (MK1L)
• Key return mode register (KRM)
The names of the test input flags and test mask flags corresponding to the test input signals are listed in Table
21-6.
Test input signal name
INTWT
INTPT4
CHAPTER 21 INTERRUPT AND TEST FUNCTIONS
Table 21-5. Test Input Factors

Test Input Factors

Watch timer overflow
Falling edge detection at port 4
Figure 21-18. Basic Configuration of Test Function
Internal bus
Test input
IF
signal
Remark IF: test input flag
MK: test mask flag
Table 21-6. Flags Corresponding to Test Input Signals
Test input flag
WTIF
KRIF
Trigger
Internal
External
MK
Standby
release signal
Test mask flag
WTMK
KRMK
Internal/
external
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